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Title of Thesis
FABRICATION AND CHARACTERIZATION OF TWO SOURCED EVAPORATED CD-BASED II-VI THIN FILMS |
Author(s)
Abid Ali |
Institute/University/Department Details
Department of Physics / Quaid-i-Azam University of Islamabad |
Session
2006 |
Subject
Physics |
Number of Pages
97 |
Keywords (Extracted from title, table of contents and abstract of thesis)
cd-based ii-vi thin films, ii-vi compound semiconductors thin films, glass substrates, cdte thin films |
Abstract The II-VI compound semiconductors thin films have been prepared by different methods such as electron beam vacuum evaporation, closed space sublimation and two-sourced thermal evaporation. The choice of the deposition method was based on the quality of the films required for specific application. In this research work mainly two-source evaporation technique is applied for sample preparation. The effects of deposition parameters, such as substrate and source temperature and annealing of the film, on the structural, optical and electrical properties have been studied. The structure' and composition of the films were studied by X-ray diffraction and Energy dispersive x-ray analysis respectively. Optical parameters such as refractive index, absorption coefficient, film thickness and optical band gap, were calculated from the optical transmission spectra recorded by spectrophotometer. The impact of evaporation rates of Cd and Te on CdTe thin films deposited by two sourced evaporation technique and their post doping effects arising from the diffusion of Cu and Ag to understand changes in the ,film properties were also studied. The ion exchange process is a very simple, and low cost technique. In this technique the dopant has to be in the form of ion in a solution, where the pre-prepared films are to be immersed, i.e. Ag(NO3) solution in case of silver doping and CU(NO3) solution in case of copper doping. The ion exchange parameters such as solution temperature, concentration and immersion time, and its effect on the speed of the process and further on the status of the resulting films was carefully determined and analyzed. Also the effect of post heat treatment, on the physical properties and the composition of the resulting films were studied. Ag and Cu doping of the CdTe thin films were successfully achieved.
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| S. No. |
Chapter |
Title of the Chapters |
Page |
Size (KB) |
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| 1 |
0 |
Contents |
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 249.58 KB |
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| 2 |
0 |
Introduction To Thin Films |
1 |
 249.58 KB |
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1.1 |
Thin Film Deposition |
3 |
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1.2 |
Glass Substrates And Their Cleaning Procedures |
6 |
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1.3 |
Coating Materials |
11 |
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1.4 |
Deposition Parameters |
9 |
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1.5 |
Frenkel Theory Of Adsorption |
10 |
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1.6 |
Semiconductor Materials |
11 |
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1.7 |
Ohmic Contact |
13 |
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1.8 |
Motivation For This Work |
13 |
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1.9 |
References |
14 |
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| 3 |
2 |
Characterization Techniques |
19 |
 538.03 KB |
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2.1 |
Scanning Electron Microscopy |
19 |
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2.2 |
Detection Of Backscattered Electrons |
20 |
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2.3 |
X-Ray Crystallography |
21 |
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2.4 |
Optical Spectroscopy |
23 |
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2.5 |
Sheet Resistance |
33 |
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2.6 |
Thin Film Thickness Monitor |
34 |
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2.7 |
Vacuum Pumps |
35 |
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2.8 |
References |
38 |
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| 4 |
3 |
Experimental Setup |
40 |
 193.52 KB |
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3.1 |
Two Source Evaporation Technique |
40 |
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3.2 |
Glass Substrates |
42 |
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3.3 |
Resistivity Measurements |
43 |
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| 5 |
4 |
Impact Of Evaporation Rates Of Cd And Te On Cdte Thin Films |
49 |
 367.26 KB |
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4.1 |
Experimental Properties |
49 |
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4.2 |
Structural Properties |
50 |
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4.3 |
Optical Properties |
54 |
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4.4 |
Electrical Properties |
59 |
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4.5 |
References |
61 |
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| 6 |
5 |
Cu-Containing Low Resistivity Cd Te Thin Films |
62 |
 357.65 KB |
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5.1 |
Experimental Procedure |
62 |
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5.2 |
Structural Properties |
64 |
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5.3 |
Optical Properties |
66 |
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5.4 |
Electrical Properties |
70 |
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5.5 |
References |
70 |
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| 7 |
6 |
Ag Doped Cd Te Thin Films |
75 |
 189.12 KB |
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6.1 |
Experimental Procedure |
75 |
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6.2 |
Results And Discussion |
75 |
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6.3 |
References |
82 |
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| 8 |
7 |
Comparison Of Cd Te/ Hg Te Thin Films |
83 |
 371.69 KB |
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7.1 |
Introduction |
83 |
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7.2 |
Experimental Techniques |
84 |
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7.3 |
Structural Properties |
87 |
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7.4 |
Optical Properties |
89 |
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7.5 |
Electrical Properties |
92 |
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7.6 |
References |
95 |
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7.7 |
Conclusion |
96 |
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